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Proceedings Paper

Improved miniature wavelength meter based on polarisation state measurements
Author(s): Karim Ouedraogo; Suat Topsu; Luc Chassagne; Jamil Nasser; Yasser Alayli
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Paper Abstract

We propose an alternative design to the wavemeters based on scanning Michelson interferometers. Using realistic experimental parameters, we show that a relative accuracy of one part in 6x10-8 can be reached with a displacement of the target mirror of only 360 &mgr;m. This improvment becomes possible thanks to the significant advances in polarimetry that permit measurement of the ellipsometric parameters &psgr; and &Dgr; with an accuracy of 0.07° with readily-available commercial equipment. This leads to an interpolation rate of &lgr;/10000. The proposed method has been setup and the chief parameters limiting its accuracy are determined.

Paper Details

Date Published: 16 May 2007
PDF: 9 pages
Proc. SPIE 6585, Optical Sensing Technology and Applications, 65850A (16 May 2007); doi: 10.1117/12.722769
Show Author Affiliations
Karim Ouedraogo, Univ. of Versailles (France)
Suat Topsu, Univ. of Versailles (France)
Luc Chassagne, Univ. of Versailles (France)
Jamil Nasser, Univ. of Versailles (France)
Yasser Alayli, Univ. of Versailles (France)

Published in SPIE Proceedings Vol. 6585:
Optical Sensing Technology and Applications
Francesco Baldini; Jiri Homola; Robert A. Lieberman; Miroslav Miler, Editor(s)

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