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Proceedings Paper

Enhanced instrumentation system to characterize the electric behavior of AFLC displays
Author(s): José M. S. Pena; José I. Santos; Juan C. Torres; Noemí Gaona; Carmen Vázquez; David Quesada
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Paper Abstract

Liquid crystals (LCs) have focused a great attention from industrial and scientific community in the last decades. The property of ferroelectricity in liquid crystals was first claimed in 1975. Five years later so-called surface-stabilized ferroelectric liquid crystals were described, which caused a surge in industrial interest because of their promising electro-optical applications. Additionally, antiferroelectricity in liquid crystals (AFLCs) was also identified in 1989. This kind of devices show interesting electrooptical properties such as tri-state switching, fast response, intrinsic analogue gray scale, wide viewing angle, among others, which are appropriate for high-end video display applications. The performance of the AFLC displays is determined by their electrical and optical behavior. In order to measure some electrical characteristics such as the switching currents and electrical loops (polarization-voltage), an A/D instrumentation system has been specially designed and implemented. A first approach of this system was reported elsewhere. However, new components were introduced and functional blocks of such version were modified in order to improve the S/N ratio. It is well known that to perform measurements of electric current ranged in the pA-nA, a specific and usually expensive equipment should be used. This work presents an enhanced A/D instrumentation system which is able to measure with reasonably precision small amplitude values of switching currents in AFLC displays. Moreover, the system can also carry out the temporal integration of the switching current allowing to obtain the electrical hysteresis of these devices.

Paper Details

Date Published: 10 May 2007
PDF: 11 pages
Proc. SPIE 6590, VLSI Circuits and Systems III, 65901R (10 May 2007); doi: 10.1117/12.722099
Show Author Affiliations
José M. S. Pena, Univ. Carlos III de Madrid (Spain)
José I. Santos, Univ. Carlos III de Madrid (Spain)
Juan C. Torres, Univ. Carlos III de Madrid (Spain)
Noemí Gaona, Univ. Carlos III de Madrid (Spain)
Carmen Vázquez, Univ. Carlos III de Madrid (Spain)
David Quesada, Univ. Carlos III de Madrid (Spain)

Published in SPIE Proceedings Vol. 6590:
VLSI Circuits and Systems III
Valentín de Armas Sosa; Kamran Eshraghian; Félix B. Tobajas, Editor(s)

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