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Proceedings Paper

Partitioning and characterization of high speed adder structures in deep-submicron technologies
Author(s): Adrián Estrada; Gashaw Sassaw; Carlos J. Jiménez; Manuel Valencia
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Paper Abstract

The availability of higher performance (in area, time and power consumption) and greater precision binary adders is a constant requirement in digital systems. Consequently, the design and characterization of adders and, most of all, their adaptation to the requisites of present-day deep-submicron technologies, are today still issues of concern. The binary adder structures in deep-submicron technologies must be revised to achieve the best balance between the number of bits in the adder and its delay, area and power consumption. It is therefore very important to make an effort to carefully optimize adder structures, thus obtaining improvements in digital systems. This communication presents the optimization of adder structures for implementations in deep-submicron technologies through their partitioning into blocks. This partitioning consists of dividing the number of input bits to the adder into several subsets of bits that will constitute the inputs to several adder structures of the same or of different types. The structures used to accomplish this study range from the more traditional types, such as the carry look ahead adder, the ripple carry adder or the carry select adder, to more innovative kinds, like the parallel prefix adders of the type proposed by Brent-Kung, Han-Carlson, Kogge-Stone or Ladner-Fischer. The analyses carried out allow the characterization of structures implemented in deep-submicron technologies for area, delay and power consumption parameters.

Paper Details

Date Published: 10 May 2007
PDF: 7 pages
Proc. SPIE 6590, VLSI Circuits and Systems III, 659004 (10 May 2007); doi: 10.1117/12.721996
Show Author Affiliations
Adrián Estrada, Univ. de Sevilla (Spain)
Gashaw Sassaw, Univ. de Sevilla (Spain)
Carlos J. Jiménez, Univ. de Sevilla (Spain)
Manuel Valencia, Univ. de Sevilla (Spain)

Published in SPIE Proceedings Vol. 6590:
VLSI Circuits and Systems III
Valentín de Armas Sosa; Kamran Eshraghian; Félix B. Tobajas, Editor(s)

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