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Proceedings Paper

Analysis of the sensitivity of integrated nonlinear optical evanescent wave sensors
Author(s): S. Taya; M. M. Shabat; M. M. Abadla; H. M. Khalil
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Paper Abstract

The dispersion relations for TE polarized waves guided by thin dielectric film surrounded by a nonlinear cladding and a linear substrate are presented. The sensitivity of the effective refractive index on the cladding index in evanescent optical waveguide sensor is derived. Closed form analytical expressions and normalized charts are given to provide the conditions for the maximum sensitivity of nonlinear sensors when the measurand is homogeneously distributed in the semi-infinite waveguide cover (homogeneous sensing). The results will be compared with those of the well known linear evanescent wave sensors.

Paper Details

Date Published: 16 May 2007
PDF: 9 pages
Proc. SPIE 6585, Optical Sensing Technology and Applications, 65851A (16 May 2007); doi: 10.1117/12.721569
Show Author Affiliations
S. Taya, Islamic Univ. of Gaza (Palestinian Territory (Occupied))
M. M. Shabat, Max-Planck-Institut für Physik komplexer Systeme (Germany)
M. M. Abadla, Alaqsa Univ. (Palestinian Territory (Occupied))
H. M. Khalil, Ain Shams Univ. (Egypt)

Published in SPIE Proceedings Vol. 6585:
Optical Sensing Technology and Applications
Francesco Baldini; Jiri Homola; Robert A. Lieberman; Miroslav Miler, Editor(s)

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