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Proceedings Paper

Design of nonlinear optical waveguide sensors with metallic cores by uniform field profile approach
Author(s): M. M. Abadla; M. M. Shabat
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Paper Abstract

TE waves can propagate in metal film of three waveguide structure if at least one of the covering media is nonlinear. The waveguide sensor under consideration consists of a metal wave guiding film coated with two nonlinear claddings. Contrary to what has been recently predicted, it is shown here that uniform field profile may be achieved under the suitable choice of the dielectric constants of the surroundings. Electric fields and fraction of power flow down the sensor layers are studied here. We expect this kind of planar waveguide sensors may be realized experimentally and will have applications in future opto-electronic devices. Uniform field approach has been discussed and implemented for the first time in investigating the waveguide sensors.

Paper Details

Date Published: 16 May 2007
PDF: 6 pages
Proc. SPIE 6585, Optical Sensing Technology and Applications, 65850P (16 May 2007); doi: 10.1117/12.721173
Show Author Affiliations
M. M. Abadla, Alaqsa Univ. (Palestinian Territory (Occupied))
M. M. Shabat, Max-Planck-Institut für Physik komplexer Systeme (Germany)

Published in SPIE Proceedings Vol. 6585:
Optical Sensing Technology and Applications
Francesco Baldini; Jiri Homola; Robert A. Lieberman; Miroslav Miler, Editor(s)

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