Share Email Print
cover

Proceedings Paper

Improved night vision demonstrator program status
Author(s): Terence L. Haran; J. Christopher James; David W. Roberts; Michael E. Knotts; Anthony A. Wasilewski; Leanne L. West; William G. Robinson; Gisele Bennett
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Although existing night vision equipment provides a significant improvement in target detection in low light conditions, there are several limitations that limit their effectiveness. Focus is a significant problem for night vision equipment due to the low f-number optics required to obtain sufficient sensitivity as well as the dynamic nature of night vision applications, which requires frequent focus adjustments. The Georgia Tech Research Institute has developed a prototype next-generation night vision device called the Improved Night Vision Demonstrator (INVD) in order to address these shortfalls. This paper will describe the design of the INVD system as well as an analysis of its performance.

Paper Details

Date Published: 4 May 2007
PDF: 12 pages
Proc. SPIE 6538, Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense VI, 653821 (4 May 2007); doi: 10.1117/12.720971
Show Author Affiliations
Terence L. Haran, Georgia Tech Research Institute (United States)
J. Christopher James, Georgia Tech Research Institute (United States)
David W. Roberts, Georgia Tech Research Institute (United States)
Michael E. Knotts, Georgia Tech Research Institute (United States)
Anthony A. Wasilewski, Georgia Tech Research Institute (United States)
Leanne L. West, Georgia Tech Research Institute (United States)
William G. Robinson, Georgia Tech Research Institute (United States)
Gisele Bennett, Georgia Tech Research Institute (United States)


Published in SPIE Proceedings Vol. 6538:
Sensors, and Command, Control, Communications, and Intelligence (C3I) Technologies for Homeland Security and Homeland Defense VI
Edward M. Carapezza, Editor(s)

© SPIE. Terms of Use
Back to Top