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Proceedings Paper

Large format resistive array (LFRA) infrared scene projector (IRSP) performance and production status
Author(s): Jim Oleson; Jay James; Joe LaVeigne; Kevin Sparkman; Greg Matis; Steve McHugh; John Lannon; Scott Goodwin; Alan Huffman; Steve Solomon
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Paper Abstract

SBIR has passed the midpoint of delivering ten 1024x1024 IR Scene Projector Systems (IRSPs) to the Government. Six systems have been installed at Redstone Technical Test Center (RTTC), Patuxent River, and Edwards Air Force Base. Four more systems are in production and will be shipped by the end of this year. The commercial name of the LFRA IRSP is Mirage XL. This ground breaking projector technology is being leveraged on the Wide Format Resistive Array (WFRA) program and on the Mirage II product. The WFRA IRSP, also known as Mirage HD, features an even larger 1536x768 emitter array and will be in system integration by the end of the year. Mirage II, which also leverages LFRA, is being readied as the next generation 512x512 projector system. Additional signal processing capabilities have been installed in the LFRA systems. Each system now has full Translation/Rotation Processing (TRP) capability. Systems also have image convolution and 400Hz 1024x512 windowing capabilities.

Paper Details

Date Published: 30 April 2007
PDF: 10 pages
Proc. SPIE 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII, 654404 (30 April 2007); doi: 10.1117/12.720550
Show Author Affiliations
Jim Oleson, Santa Barbara Infrared, Inc. (United States)
Jay James, Santa Barbara Infrared, Inc. (United States)
Joe LaVeigne, Santa Barbara Infrared, Inc. (United States)
Kevin Sparkman, Santa Barbara Infrared, Inc. (United States)
Greg Matis, Santa Barbara Infrared, Inc. (United States)
Steve McHugh, Santa Barbara Infrared, Inc. (United States)
John Lannon, RTI International (United States)
Scott Goodwin, RTI International (United States)
Alan Huffman, RTI International (United States)
Steve Solomon, Acumen Scientific (United States)


Published in SPIE Proceedings Vol. 6544:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
Robert Lee Murrer, Editor(s)

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