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Proceedings Paper

Pelican: SCD's 640 × 512/15 µm pitch InSb detector
Author(s): J. Oiknine Schlesinger; Z. Calahorra; E. Uri; O. Shick; T. Fishman; I. Shtrichman; E. Sinbar; V. Nahum; E. Kahanov; B. Shlomovich; S. Hasson; N. Fishler; D. Chen; T. Markovitz
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Paper Abstract

Over the last decade, SCD has developed and manufactured high quality InSb Focal Plane Arrays (FPAs), that are currently used in different applications worldwide. SCD's production line includes InSb FPAs with mid format (320x256 elements), and large format (640x512 elements), all available in various packaging configurations, including fully integrated Detector-Dewar-Cooler Assemblies (DDCA). Many of SCD's products are fully customized for customers' needs, and are optimized for each application with respect to the weight, power, size, and performance. In 2006, SCD has added to its broad InSb product portfolio the new "Pelican" detector family. All Pelican detectors include a large format 640×512 InSb FPA with 15&mgr;m pitch, which is based on the FLIR/Indigo ISC0403 Readout Integrated Circuit (ROIC). Due to its small size, the Pelican FPA fits in any mid format Dewar, enabling upgrading of mid format systems with higher spatial resolution due to its good MTF. This work presents the high performance of Pelican products. As achieved in all SCD's InSb DDC's, the Pelican detectors demonstrate high uniformity and correctability (residual non uniformity less than 0.05% std/DR) and remarkable operability (typically better than 99.9%). The Pelican FPA can be integrated in various DDCA configurations as per application needs, such as light weight, low power and compact form for hand held imagers, or a rigid configuration for environmentally demanding operating and storage conditions.

Paper Details

Date Published: 14 May 2007
PDF: 8 pages
Proc. SPIE 6542, Infrared Technology and Applications XXXIII, 654231 (14 May 2007); doi: 10.1117/12.720520
Show Author Affiliations
J. Oiknine Schlesinger, SCD SemiConductor Devices (Israel)
Z. Calahorra, SCD SemiConductor Devices (Israel)
E. Uri, SCD SemiConductor Devices (Israel)
O. Shick, SCD SemiConductor Devices (Israel)
T. Fishman, SCD SemiConductor Devices (Israel)
I. Shtrichman, SCD SemiConductor Devices (Israel)
E. Sinbar, SCD SemiConductor Devices (Israel)
V. Nahum, SCD SemiConductor Devices (Israel)
E. Kahanov, SCD SemiConductor Devices (Israel)
B. Shlomovich, SCD SemiConductor Devices (Israel)
S. Hasson, SCD SemiConductor Devices (Israel)
N. Fishler, SCD SemiConductor Devices (Israel)
D. Chen, SCD SemiConductor Devices (Israel)
T. Markovitz, SCD SemiConductor Devices (Israel)

Published in SPIE Proceedings Vol. 6542:
Infrared Technology and Applications XXXIII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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