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Proceedings Paper

Spectral characterization of diffractively structured GaAs using the ARISTMS
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Paper Abstract

Spectral results including reflectance, transmittance, rTIS, and tTIS are presented for diffractively structured GaAs using the Automated Rasterable Integrated Spectrometric and Total Integrated Scatter Measurement System (ARISTMS). The data is for the bandwidth of 10&mgr;m to 12&mgr;m over a range of incidence angles between 0° to 75°. A description of the diffractively structured GaAs and the operation of the ARISTMS are given.

Paper Details

Date Published: 2 May 2007
PDF: 7 pages
Proc. SPIE 6545, Window and Dome Technologies and Materials X, 654505 (2 May 2007); doi: 10.1117/12.720419
Show Author Affiliations
Phil Coulter, MilSys Technologies LLC (United States)
Michael Wilson, MilSys Technologies LLC (United States)

Published in SPIE Proceedings Vol. 6545:
Window and Dome Technologies and Materials X
Randal W. Tustison, Editor(s)

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