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Proceedings Paper

Motheye structured surface fabrication as durable anti-reflection treatment on CdZnTe for space-based LWIR detector devices
Author(s): Neeta Agarwal; Lee M. Goldman; Suri Sastri; Robert Ondercin; Paul Kobrin
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Paper Abstract

Space based HgCdTe imaging devices, built on CdZnTe substrates, require radiation hardened anti-reflection (AR) treatments in order to withstand the rigors of the space environment. Conventional anti-reflection (AR) coatings provide adequate optical performance but are prone to delamination and degradation due to extreme temperature cycling and irradiation in space. Consequently, there is an intense need for improved AR technology that combines high optical performance with improved durability. Etching physical gradient or motheye structures directly into the CdZnTe eliminates the need to deposit additional layers of different materials onto the substrate, avoiding the possibility of delamination and cross contamination. Motheye AR surfaces, under development at Surmet Corporation, have demonstrated excellent broadband optical performance in the LWIR (7 to14 micron) waveband. Surmet's motheye technology involves direct etching of a regular pattern of fine features into the CdZnTe substrate, using standard lithography and dry etching techniques. The results from this ongoing research and development effort are discussed.

Paper Details

Date Published: 14 May 2007
PDF: 7 pages
Proc. SPIE 6542, Infrared Technology and Applications XXXIII, 65422B (14 May 2007); doi: 10.1117/12.720202
Show Author Affiliations
Neeta Agarwal, Surmet Corp. (United States)
Lee M. Goldman, Surmet Corp. (United States)
Suri Sastri, Surmet Corp. (United States)
Robert Ondercin, AFRL/MLPS (United States)
Paul Kobrin, Teledyne Scientific and Imaging LLC (United States)

Published in SPIE Proceedings Vol. 6542:
Infrared Technology and Applications XXXIII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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