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Proceedings Paper

Experimental estimation of the recognition reliability in the optical pattern recognition systems
Author(s): Veacheslav L. Perju; David P. Casasent; Igor A. Mardare; Oleg V. Chirca
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Paper Abstract

A method of the recognition reliability estimation in the optical pattern recognition systems (OPRS) is described, based on of the similarity measures differences (SMD). It was theoretically justified and experimentally confirmed a hypothesis about the distribution law of the SMD. There were calculated the reliabilities of the correct objects recognition at single and coded correlation responses in OPRS of invariant and normalized images processing.

Paper Details

Date Published: 9 April 2007
PDF: 12 pages
Proc. SPIE 6574, Optical Pattern Recognition XVIII, 65740N (9 April 2007); doi: 10.1117/12.720177
Show Author Affiliations
Veacheslav L. Perju, Technical Univ. of Moldova (Moldova)
Free International Univ. of Moldova (Moldova)
David P. Casasent, Carnegie Mellon Univ. (United States)
Igor A. Mardare, Technical Univ. of Moldova (Moldova)
Oleg V. Chirca, Free International Univ. of Moldova (Moldova)


Published in SPIE Proceedings Vol. 6574:
Optical Pattern Recognition XVIII
David P. Casasent; Tien-Hsin Chao, Editor(s)

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