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Proceedings Paper

Balancing measurement time and uncertainty when stitching in production environments
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Paper Abstract

Long measurement times can be a bottleneck in an optics production environment. Ideally the measurement time will be quicker than polishing times. Large aperture and high precision parts, however, tend toward slower measurement times. Additionally, such parts usually need dedicated and expensive test setups. In 2004, QED Technologies introduced the Subaperture Stitching Interferometer (SSI®) to automatically stitch spherical surfaces (including hemispheres) up to 280 mm. The system also reduces measurement uncertainty with in-line calibration of systematic errors. With stitching, measurement time is a variable that can impact measurement uncertainty. The user can control such parameters as lattice design, systematic error calibration, and acquisition speed to optimally balance measurement speed and quality. We empirically demonstrate the trade-offs between measurement uncertainty and cycle time on the SSI.

Paper Details

Date Published: 14 May 2007
PDF: 4 pages
Proc. SPIE TD04, Optifab 2007: Technical Digest, TD040T (14 May 2007); doi: 10.1117/12.719818
Show Author Affiliations
Gary DeVries, QED Technologies (United States)
Paul E. Murphy, QED Technologies (United States)

Published in SPIE Proceedings Vol. TD04:
Optifab 2007: Technical Digest
James J. Kumler; Matthias Pfaff, Editor(s)

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