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Proceedings Paper

Effects of mesh voids on insertion loss of metallic mesh coatings
Author(s): Jennifer Halman; Keith Ramsey; Vashti Sawtelle
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Paper Abstract

Metallic mesh thin-film coatings have been used for many years to provide electromagnetic interference (EMI) shielding on infrared windows and domes. During the fabrication of these conductive, micron-sized mesh patterns, mesh voids or holes in the mesh pattern occasionally occur. Voids in the mesh degrade the EMI shielding or insertion loss of the mesh coating. In the past, we have shown that a small number of 1-mm voids do not degrade the insertion loss significantly for 20-dB insertion-loss mesh coatings. In this paper, we present a theory that provides an approximation for the number and size of mesh voids that can be tolerated without degrading the EMI shielding properties of a mesh coating. We also measured the insertion loss of several typical metallic-mesh coatings with and without voids and compared the results with our simple insertion loss model. Our analysis shows that tens of very small voids may have only minimal impact on the EMI shielding properties of a metallic mesh coating. Even a single 3-mm diameter void may not degrade the shielding properties significantly.

Paper Details

Date Published: 2 May 2007
PDF: 7 pages
Proc. SPIE 6545, Window and Dome Technologies and Materials X, 65450X (2 May 2007); doi: 10.1117/12.719807
Show Author Affiliations
Jennifer Halman, Battelle Memorial Institute (United States)
Keith Ramsey, Battelle Memorial Institute (United States)
Vashti Sawtelle, Battelle Memorial Institute (United States)

Published in SPIE Proceedings Vol. 6545:
Window and Dome Technologies and Materials X
Randal W. Tustison, Editor(s)

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