Share Email Print
cover

Proceedings Paper

Correlation between the number of spatial, thermal, and total cues in LWIR imagery and probability of identification
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A human perception test has been conducted to determine the correlation between observer response and the number of spatial cues without thermal attributes, thermal cues, and total cues in an image. The experiment used the NVESD 12 target LWIR tracked vehicle image set. Various levels of Gaussian blur were applied to twelve aspects of the twelve targets in order to reduce both the number of resolvable cycles and the number of observable thermal and spatial cues. The author then counted every observable thermal and spatial cue in each of the processed images. A thermal cue was defined as either a hot spot or a cool spot. Typically, hot spots are produced by a vehicle's engine or exhaust. Cool spots are features such as air intakes and trim vanes. Spatial cues included characteristics such as barrel length, turret size, and number of wheels. The results of a 12 alternative forced choice identification perception test were analyzed to determine the correlation coefficients between probability of identification and the number of thermal, spatial, and total cues. The results show that the number of spatial cues in an image was strongly correlated with observer performance.

Paper Details

Date Published: 4 May 2007
PDF: 12 pages
Proc. SPIE 6543, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII, 65430Q (4 May 2007); doi: 10.1117/12.719751
Show Author Affiliations
Matthew Brickell, The Univ. of Memphis (United States)
Timothy Edwards, Redstone Technical Test Ctr. (United States)
Carl Halford, The Univ. of Memphis (United States)
Kevin Dennen, ERC, Inc. (United States)


Published in SPIE Proceedings Vol. 6543:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII
Gerald C. Holst, Editor(s)

© SPIE. Terms of Use
Back to Top