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Proceedings Paper

Solutions for the fabrication of freeform optical surfaces
Author(s): Robert Cassin; Yazid E. Tohme
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Paper Abstract

The fabrication of different spherical and aspherical optical surfaces often presents various challenges. Additionally, the fabrication of freeform optics presents special and often unique challenges beyond standard rotationally symmetric components. Consequently, not all freeform optics can be manufactured utilizing standard methods. Diverse manufacturing techniques are necessary depending on part size, surface frequency content, surface slopes, and required materials. These techniques could include single point diamond machining using our slow slide servo technique, fast tool servo machining, raster fly-cutting, micro-milling, and freeform deterministic grinding. There is a recognized need in the industry to simplify and improve the production of aspheric and freeform optical surfaces. Recognizing this demand Moore Nanotechnology Systems has developed an innovative new software tool called NanoCAM™. This presentation will describe the latest advancements made at Moore Nanotechnology Systems to integrate the entire production cycle in one comprehensive software tool that can interact with all systems from optical design tools, to production machines as well as measurement equipment. NanoCAM™ solves the complex challenges involved with freeform machining, and the result is improved product quality, simplified processes, and enhanced performance. NanoCAM™ is designed to be used with the Nanotech 250UPL, Nanotech 450UPL, and Nanotech 350FG as well as the Nanotech Fast Tool Servo (NFTS-6000).

Paper Details

Date Published: 14 May 2007
PDF: 3 pages
Proc. SPIE TD04, Optifab 2007: Technical Digest, TD0418 (14 May 2007); doi: 10.1117/12.719678
Show Author Affiliations
Robert Cassin, Moore Nanotechnology Systems LLC (United States)
Yazid E. Tohme, Moore Nanotechnology Systems LLC (United States)


Published in SPIE Proceedings Vol. TD04:
Optifab 2007: Technical Digest
James J. Kumler; Matthias Pfaff, Editor(s)

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