Share Email Print

Proceedings Paper

Spectral decomposition of ultra-wide-band terahertz imagery
Author(s): E. N. Grossman; C. R. Dietlein; J. Chisum; A. Luukanen; J. E. Bjarnasson; E. R. Brown
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We investigate the spectral response of a THz imaging system based on ultrawideband cryogenic microbolometers. The bandwidth if this system, nominally 0.2 - 1.8 THz, is broad enough to span large variations (>10 dB) in clothing transmittance and diffraction-limited spatial resolution (factor of x8), factors that are presumably partly responsible for the unusually high quality of the images taken with it. The chief tools we have used for this are a simple THz monochromator based on a specially designed frequency selective surface, and a specially designed blackbody source that provides an accurately known power spectral density over the full bandwidth of the imager. Two completely independent measurements of the microbolometer's spectral response, in the first case using a filtered blackbody and in the second using an ultrabroadband, THz photomixer, referred to a Golay cell, agree within 5%. Evidence of frequency-dependent scattering from ordinary clothing material, distinct from simple linear attenuation, is presented from an idealized laboratory experiment. However, the scattering is relatively weak, and unlikely to have a significant effect in practical THz imaging scenarios, particularly with ultrawide bandwidths.

Paper Details

Date Published: 1 May 2007
PDF: 8 pages
Proc. SPIE 6548, Passive Millimeter-Wave Imaging Technology X, 654807 (1 May 2007); doi: 10.1117/12.719632
Show Author Affiliations
E. N. Grossman, National Institute of Standards and Technology (United States)
C. R. Dietlein, National Institute of Standards and Technology (United States)
Univ. of Colorado at Boulder (United States)
J. Chisum, National Institute of Standards and Technology (United States)
Univ. of Colorado at Boulder (United States)
A. Luukanen, Millimetre-wave Lab. of Finland (Finland)
J. E. Bjarnasson, Univ. of California, Santa Barbara (United States)
E. R. Brown, Univ. of California, Santa Barbara (United States)

Published in SPIE Proceedings Vol. 6548:
Passive Millimeter-Wave Imaging Technology X
Roger Appleby; David A. Wikner, Editor(s)

© SPIE. Terms of Use
Back to Top