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Proceedings Paper

Finesse of silicon-based terahertz Fabry-Perot spectrometer
Author(s): Justin W. Cleary; Robert E. Peale; Ravi Todi; Kalpathy Sundaram; Oliver Edwards
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Paper Abstract

This paper considers factors that affect achievable finesse for a recently demonstrated silicon-based scanning Fabry- Perot transmission filter at millimeter and sub-millimeter wavelengths. The mirrors are formed by alternating quarter-wave optical thicknesses of silicon and air in the usual Bragg configuration. Fundamental loss by lattice and free carrier absorption are considered. Technological factors such as surface roughness, bowing, and misalignment are considered for various proposed manufacturing schemes.

Paper Details

Date Published: 4 May 2007
PDF: 7 pages
Proc. SPIE 6549, Terahertz for Military and Security Applications V, 65490R (4 May 2007); doi: 10.1117/12.719577
Show Author Affiliations
Justin W. Cleary, Univ. of Central Florida (United States)
Robert E. Peale, Univ. of Central Florida (United States)
Ravi Todi, Univ. of Central Florida (United States)
Kalpathy Sundaram, Univ. of Central Florida (United States)
Oliver Edwards, Zyberwear Inc. (United States)


Published in SPIE Proceedings Vol. 6549:
Terahertz for Military and Security Applications V
James O. Jensen; Hong-Liang Cui, Editor(s)

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