Share Email Print

Proceedings Paper

A nondestructive method for diagnostic of insulated building walls using infrared thermography
Author(s): Mohamed H. A. Larbi Youcef; Atef Mazioud; Pierre Bremond; Laurent Ibos; Yves Candau; Michel Piro; Alain Filloux
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

This work deals with the development of an experimental protocol for the diagnostic of multi-layered insulated building walls. First, a test bench is set up in order to measure front and back sides temperatures of standard panels. The panels considered have insulation thicknesses of 2, 6 and 10cm. The front side is heated by two halogen lamps of 500W. A CEDIP Jade Long wave infrared camera and thermocouples are used to carry out temperature measurements. In a second time, a one dimensional model based on thermal quadruples and Laplace transforms was developped under Matlab environment. Also, we developped a three dimensional model based on finite volumes using Fluent computational code. Finally, a method of identification of physical parameters is implemented by performing least square minimization based on Levenberg-Marquardt method. The experimental measurements are compared to theoretical results and by minimization we obtain thermal conductivity and diffusivity as well as thickness of the two layers.

Paper Details

Date Published: 9 April 2007
PDF: 8 pages
Proc. SPIE 6541, Thermosense XXIX, 65410L (9 April 2007); doi: 10.1117/12.719378
Show Author Affiliations
Mohamed H. A. Larbi Youcef, Univ. Paris XII (France)
Atef Mazioud, Univ. Paris XII (France)
Pierre Bremond, Cedip Infrared Systems (France)
Laurent Ibos, Univ. Paris XII (France)
Yves Candau, Univ. Paris XII (France)
Michel Piro, EDF R&D (France)
Alain Filloux, Alpheeis (France)

Published in SPIE Proceedings Vol. 6541:
Thermosense XXIX
Kathryn M. Knettel; Vladimir P. Vavilov; Jonathan J. Miles, Editor(s)

© SPIE. Terms of Use
Back to Top