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Proceedings Paper

Characterization of a C-QWIP LWIR camera
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Paper Abstract

Large format corrugated quantum well infrared photodetector (C-QWIP) focal plane arrays (FPAs) have been developed over the past two years. The results of this development have demonstrated the potential for this technology to satisfy requirements for very large format high performance long-wave infrared (LWIR) imaging systems. One particular C-QWIP design has focused on developing an FPA that operates in the 8 to 10 &mgr;m spectrum with integration times in the millisecond regime when used against warm backgrounds. This FPA is very suitable for many LWIR applications and has been integrated into a camera system. The specifications of that camera are described in this paper. The characterization of this camera system includes standard electro-optical tests and compares the results of those tests to theoretical models for the FPA. This paper concludes by describing the ongoing effort to tailor the system specifically for the C-QWIP. This includes design features of the read-out integrated circuit (ROIC), dewar-cooler design and interfacing electronics, and video processing. This thorough characterization of the camera has demonstrated the utility of the C-QWIP FPA for LWIR imaging and has established a path forward to further improve the performance of imaging systems implementing this technology.

Paper Details

Date Published: 30 April 2007
PDF: 8 pages
Proc. SPIE 6543, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII, 654317 (30 April 2007); doi: 10.1117/12.719255
Show Author Affiliations
David P. Forrai, L-3 Communications Cincinnati Electronics, Inc. (United States)
Mark Sempsrott, L-3 Communications Cincinnati Electronics, Inc. (United States)
Robert Fischer, L-3 Communications Cincinnati Electronics, Inc. (United States)
Kwong-Kit Choi, U.S. Army Research Lab. (United States)
John W. Devitt, L-3 Communications Cincinnati Electronics, Inc. (United States)


Published in SPIE Proceedings Vol. 6543:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII
Gerald C. Holst, Editor(s)

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