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Proceedings Paper

Large format and high sensitivity VOx μ-bolometer detectors at SCD
Author(s): U. Mizrahi; L. Bikov; A. Giladi; A. Adin; N. Shiloah; E. Malkinson; T. Czyzewski; D. Seter; A. Amsterdam; Y. Sinai; A. Fraenkel
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Paper Abstract

SCD has established an uncooled detector product line based on the high-end VOx μ-bolometer technology. The first PFA launched was BIRD384, a 384x288 (or 320x240) configurable format with 25μm pitch. Typical NETD values for these FPAs are below 50mK with an F/1 aperture and 60 Hz frame rate. The product exhibits superior image uniformity, stability and reduced power consumption, making it most suitable for a broad range of "high-end" military and commercial applications. In this paper we report on our progress in development of new products in accordance with SCD's uncooled products roadmap: 1. A "sensitive" version of BIRD384 with an improved NETD of ~ 30mK @ F/1, 60Hz frame rate. This performance is achieved by optimizing concurrently the membrane structure, pixel architecture and ROIC electronics. 2. An improved version of BIRD384 ROIC that supports 100/120Hz frame rate and high dynamic range ("Fire Man" option). 3. First data of the BIRD640 - a 640x480 array with 25μm pitch and NETD ≤ 50mK @ F/1, 60Hz frame rate.

Paper Details

Date Published: 14 May 2007
PDF: 7 pages
Proc. SPIE 6542, Infrared Technology and Applications XXXIII, 65421X (14 May 2007); doi: 10.1117/12.719198
Show Author Affiliations
U. Mizrahi, SemiConductor Devices (Israel)
L. Bikov, SemiConductor Devices (Israel)
A. Giladi, SemiConductor Devices (Israel)
A. Adin, SemiConductor Devices (Israel)
N. Shiloah, SemiConductor Devices (Israel)
E. Malkinson, SemiConductor Devices (Israel)
T. Czyzewski, SemiConductor Devices (Israel)
D. Seter, SemiConductor Devices (Israel)
A. Amsterdam, SemiConductor Devices (Israel)
Y. Sinai, SemiConductor Devices (Israel)
A. Fraenkel, SemiConductor Devices (Israel)


Published in SPIE Proceedings Vol. 6542:
Infrared Technology and Applications XXXIII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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