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Proceedings Paper

Broad-band optical test bench (OPTISHOP) to measure MTF and transmittance of visible and IR optical components
Author(s): Dario Cabib; Amir Rahav; Tamir Barak
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Paper Abstract

CI Systems has developed a new cost effective and modular Optical Test Bench to measure Modulation Transfer Function (MTF) and transmittance of optical components in the Visible/Near Infrared (0.4-1.7 microns) and infrared (3 to 14 microns) spectral ranges (the OPTISHOP system). The optical design concept of the system allows the user to switch from MTF (on- and off-axis) to transmittance measurements, without need of optical alignment by the user. In addition, broad band sources are used for illumination, so that these optical properties can be measured in the whole relevant wavelength range of the components to be tested (usually visible and/or near infrared separately from the infrared range). Other lens measurements such as effective focal length can be made. Back focal length, distortion and field curvature are being developed. The system is based on the standard and proven CTS (Collimator Test System) product line of CI, which is made of reflective optics for wide wavelength coverage, and it is ruggedly built for use in the laboratory, production line or maintenance depot. An advantage of the CTS configuration is that the source-collimator assembly is enclosed in a robust mechanical envelope, which prevents accidental misalignements and breakage, optical misalignments due to environment temperature drifts, soiling of the optics, and easier system transportation. The system is described here, including calibration and validation techniques.

Paper Details

Date Published: 30 April 2007
PDF: 8 pages
Proc. SPIE 6543, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII, 654311 (30 April 2007); doi: 10.1117/12.719170
Show Author Affiliations
Dario Cabib, CI Systems Ltd. (Israel)
Amir Rahav, CI Systems Ltd. (Israel)
Tamir Barak, CI Systems Ltd. (Israel)

Published in SPIE Proceedings Vol. 6543:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII
Gerald C. Holst, Editor(s)

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