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Proceedings Paper

Multiplexing low-coherence interferometer sensors: laboratory tests and design for integration within RC structures
Author(s): Matteo Pozzi; Daniele Zonta; Huayong Wu; Daniele Inaudi
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Paper Abstract

One of the advantages of fiber optics with respect to traditional electrical gauges is they can act both as sensors and as a pathway for signals produced by other sensors. This feature allows adoption of a simple sensor system architecture, even when arrays of many sensors are needed. In this paper, we present the development and laboratory validation of in-line multiplexing for the low-coherence interferometric SOFO standard deformation sensor. A standard SOFO, as developed, produced and commercialized by Smartec SA, employs total reflectors at the end of the measurement and the reference fibers, allowing measurement of the strain over a single field. In the solution presented, broadband Fiber Bragg Gratings (FBGs) are employed as partial reflectors to obtain in-line multiplexing. These FBGs, presenting a 5% reflectivity in their reflection spectra, are produced using a chirped phase mask. An experiment was carried out on a 3-field sensor, to investigate effectiveness, resolution and temperature sensitivity. Outcomes show clear fringe visibility for each pair of gratings and a resolution of about 2.5 &mgr;m RMS, of the same order as the single field sensor. Issues regarding the maximum number of measurement fields on a single line and deformation range limits are discussed.

Paper Details

Date Published: 10 April 2007
PDF: 12 pages
Proc. SPIE 6529, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2007, 65293I (10 April 2007); doi: 10.1117/12.718750
Show Author Affiliations
Matteo Pozzi, Univ. of Trento (Italy)
Daniele Zonta, Univ. of Trento (Italy)
Huayong Wu, Univ. of Trento (Italy)
Daniele Inaudi, Smartec SA (Switzerland)


Published in SPIE Proceedings Vol. 6529:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2007
Masayoshi Tomizuka; Chung-Bang Yun; Victor Giurgiutiu, Editor(s)

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