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Proceedings Paper

Transmitted wavefront metrology of hemispheric domes using scanning low-coherence dual-interferometry (SLCDI)
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Paper Abstract

Modern missile domes are up to 7 inches in diameter, subtending an angular aperture of 180 degrees. Quantifying the transmitted wavefront of these domes is critical for quality control, but such optics are diffcult or impossible to measure using conventional interferometric techniques. To address this issue, we have developed a non-contact measurement process that uses a technology similar to optical coherence tomography (OCT) to map the optical thickness of the dome over its full aperture. The technique has been termed Scanning Low Coherence Dual Interferometry (SLCDI), and has the unique ability to measure the optical thickness of component layers within multilayer domes to an accuracy of 0.1 micron. In this paper we demonstrate the capability of SLCDI by measuring the optical thickness of a seven inch diameter BK7 dome at a sampling resolution of 0.2 mm. SLCDI yields results comparable to those from a Zygo interferometer, and the two methods agree to within 0.2 micron. From this we conclude that SLCDI is an effective tool for measuring the optical quality of hemispheric domes.

Paper Details

Date Published: 2 May 2007
PDF: 10 pages
Proc. SPIE 6545, Window and Dome Technologies and Materials X, 65450N (2 May 2007); doi: 10.1117/12.718737
Show Author Affiliations
Damon W. Diehl, ASE Optics, Inc. (United States)
Christopher Cotton, ASE Optics, Inc. (United States)
Christopher J. Ditchman, ASE Optics, Inc. (United States)
Bryan Statt, ASE Optics, Inc. (United States)

Published in SPIE Proceedings Vol. 6545:
Window and Dome Technologies and Materials X
Randal W. Tustison, Editor(s)

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