Share Email Print
cover

Proceedings Paper

Research on portable maintenance aid equipment using ARM-based VXI modules
Author(s): Hu Bao; ChaoLong Ying; QingWei Shi; JianFu Teng
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In a large-scale warship electronic equipment ATE, the main testing system is designed as an intermediate-level test system, which will perform automatic test and fault localization up to SRUs level. UUTs of the system are faulty LRUs. Different from small-scale aircraft avionics, Built-In Test (BIT) in current warships electronic equipments might arise too much ambiguous fault isolation and could not detect the failure of cables, which results in high false removal rates and causes a lot of manpower and resources waste. The situation will be worse when the deployment of main testing system is usually confined to the site. In this paper, we aim at developing a kind of Portable Maintenance Aid Equipment (PMAE) based on VXI bus technology in order to overcome above restrictions where 0-slot controller as well as some dedicated test modules are designed using ARM based embedded system. The PMAE could cooperate with the main testing system in realizing remote measurement and control through virtual instrument (VI) technology, thus the localization veracity of faulty LRUs and cables could be greatly improved. Test results indicated good performance of this scheme, thereby greatly augmenting diagnostic capacity and efficiency of the large-scale warships ATE.

Paper Details

Date Published: 30 October 2006
PDF: 7 pages
Proc. SPIE 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation, 63582B (30 October 2006); doi: 10.1117/12.718027
Show Author Affiliations
Hu Bao, Tianjin Univ. (China)
Naval Aeronautical Engineering Institute (China)
ChaoLong Ying, Naval Aeronautical Engineering Institute (China)
QingWei Shi, LiaoNing Technical Univ. (China)
JianFu Teng, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 6358:
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation
Jiancheng Fang; Zhongyu Wang, Editor(s)

© SPIE. Terms of Use
Back to Top