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Proceedings Paper

A PLM-based automated inspection planning system for coordinate measuring machine
Author(s): Haibin Zhao; Junying Wang; Boxiong Wang; Jianmei Wang; Huacheng Chen
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Paper Abstract

With rapid progress of Product Lifecycle Management (PLM) in manufacturing industry, automatic generation of inspection planning of product and the integration with other activities in product lifecycle play important roles in quality control. But the techniques for these purposes are laggard comparing with techniques of CAD/CAM. Therefore, an automatic inspection planning system for Coordinate Measuring Machine (CMM) was developed to improve the automatization of measuring based on the integration of inspection system in PLM. Feature information representation is achieved based on a PLM canter database; measuring strategy is optimized through the integration of multi-sensors; reasonable number and distribution of inspection points are calculated and designed with the guidance of statistic theory and a synthesis distribution algorithm; a collision avoidance method is proposed to generate non-collision inspection path with high efficiency. Information mapping is performed between Neutral Interchange Files (NIFs), such as STEP, DML, DMIS, XML, etc., to realize information integration with other activities in the product lifecycle like design, manufacturing and inspection execution, etc. Simulation was carried out to demonstrate the feasibility of the proposed system. As a result, the inspection process is becoming simpler and good result can be got based on the integration in PLM.

Paper Details

Date Published: 30 October 2006
PDF: 6 pages
Proc. SPIE 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation, 635829 (30 October 2006); doi: 10.1117/12.718015
Show Author Affiliations
Haibin Zhao, Tsinghua Univ. (China)
Junying Wang, Tsinghua Univ. (China)
Boxiong Wang, Tsinghua Univ. (China)
Jianmei Wang, Tsinghua Univ. (China)
Huacheng Chen, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 6358:
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation
Jiancheng Fang; Zhongyu Wang, Editor(s)

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