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Proceedings Paper

Study on automatic testing network based on LXI
Author(s): Qin Hu; Xing Xu
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Paper Abstract

LXI (LAN eXtensions for Instrumentation), which is an extension of the widely used Ethernet technology in the automatic testing field, is the next generation instrumental platform. LXI standard is based on the industry standard Ethernet technolog, using the standard PC interface as the primary communication bus between devices. It implements the IEEE802.3 standard and supports TCP/IP protocol. LXI takes the advantage of the ease of use of GPIB-based instruments, the high performance and compact size of VXI/PXI instruments, and the flexibility and high throughput of Ethernet all at the same time. The paper firstly introduces the specification of LXI standard. Then, an automatic testing network architecture which is based on LXI platform is proposed. The automatic testing network is composed of several sets of LXI-based instruments, which are connected via an Ethernet switch or router. The network is computer-centric, and all the LXI-based instruments in the network are configured and initialized in computer. The computer controls the data acquisition, and displays the data on the screen. The instruments are using Ethernet connection as I/O interface, and can be triggered over a wired trigger interface, over LAN or over IEEE 1588 Precision Time Protocol running over the LAN interface. A hybrid automatic testing network comprised of LXI compliant devices and legacy instruments including LAN instruments as well as GPIB, VXI and PXI products connected via internal or external adaptors is also discussed at the end of the paper.

Paper Details

Date Published: 28 October 2006
PDF: 4 pages
Proc. SPIE 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation, 635821 (28 October 2006); doi: 10.1117/12.717971
Show Author Affiliations
Qin Hu, Beijing Univ. of Aeronautics and Astronautics (China)
Xing Xu, Beijing Univ. of Aeronautics and Astronautics (China)


Published in SPIE Proceedings Vol. 6358:
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation
Jiancheng Fang; Zhongyu Wang, Editor(s)

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