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Proceedings Paper

Automated target classification in high resolution dual frequency sonar imagery
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Paper Abstract

An improved computer-aided-detection / computer-aided-classification (CAD/CAC) processing string has been developed. The classified objects of 2 distinct strings are fused using the classification confidence values and their expansions as features, and using "summing" or log-likelihood-ratio-test (LLRT) based fusion rules. The utility of the overall processing strings and their fusion was demonstrated with new high-resolution dual frequency sonar imagery. Three significant fusion algorithm improvements were made. First, a nonlinear 2nd order (Volterra) feature LLRT fusion algorithm was developed. Second, a Box-Cox nonlinear feature LLRT fusion algorithm was developed. The Box-Cox transformation consists of raising the features to a to-be-determined power. Third, a repeated application of a subset feature selection / feature orthogonalization / Volterra feature LLRT fusion block was utilized. It was shown that cascaded Volterra feature LLRT fusion of the CAD/CAC processing strings outperforms summing, baseline single-stage Volterra and Box-Cox feature LLRT algorithms, yielding significant improvements over the best single CAD/CAC processing string results, and providing the capability to correctly call the majority of targets while maintaining a very low false alarm rate. Additionally, the robustness of cascaded Volterra feature fusion was demonstrated, by showing that the algorithm yields similar performance with the training and test sets.

Paper Details

Date Published: 26 April 2007
PDF: 12 pages
Proc. SPIE 6553, Detection and Remediation Technologies for Mines and Minelike Targets XII, 65530S (26 April 2007); doi: 10.1117/12.717739
Show Author Affiliations
Tom Aridgides, Lockheed Martin Corp. (United States)
Manuel Fernández, Lockheed Martin Corp. (United States)


Published in SPIE Proceedings Vol. 6553:
Detection and Remediation Technologies for Mines and Minelike Targets XII
Russell S. Harmon; J. Thomas Broach; John H. Holloway, Editor(s)

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