Share Email Print
cover

Proceedings Paper

Using IVI drivers to achieve instrument interchangeability
Author(s): Qingfeng Yuan; Honglei Qing; Hui Lu
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Instrument interchangeability has been a desire of test engineers for many years. When developing long-life systems that need to be maintained for more than 20 years, it is important to have the ability to exchange instruments in those systems when they become damaged or obsolete. Interchangeable Virtual Instrument (IVI) is a new test and measurement instrument driver standard introduced by the IVI Foundation. The IVI Foundation's goal is to create a driver standard that allows a high degree of instrument interchangeability while still providing high-performance. This paper presents guide methods of using IVI drivers to achieve instrument interchangeability. The paper begins by reviewing the development of instrument drivers and introducing the specification and architecture of IVI system. The emphasis of the paper is on expressing how to achieve instrument interchangeability with IVI-C and IVI-COM drivers and describing how IVI drivers and associated IVI configuration server are used to develop a system. The corresponding examples are shown. The paper provides a configuration utility allowing configuration information to be viewed, added, modified, and deleted as needed in the configuration store. Finally, the paper summarizes the minimum requirements for interchangeability with IVI class drivers.

Paper Details

Date Published: 28 October 2006
PDF: 7 pages
Proc. SPIE 6358, Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation, 63580L (28 October 2006); doi: 10.1117/12.717658
Show Author Affiliations
Qingfeng Yuan, Beijing Univ. of Aeronautics and Astronautics (China)
Honglei Qing, Beijing Univ. of Aeronautics and Astronautics (China)
Hui Lu, Beijing Univ. of Aeronautics and Astronautics (China)


Published in SPIE Proceedings Vol. 6358:
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation
Jiancheng Fang; Zhongyu Wang, Editor(s)

© SPIE. Terms of Use
Back to Top