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Proceedings Paper

The study of dual camera 3D coordinate vision measurement system using a special probe
Author(s): Shugui Liu; Kai Peng; Xuefei Zhang; Haifeng Zhang; Fengshan Huang
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Paper Abstract

Due to high precision and convenient operation, the vision coordinate measurement machine with one probe has become the research focus in visual industry. In general such a visual system can be setup conveniently with just one CCD camera and probe. However, the price of the system will surge up too high to accept while the top performance hardware, such as CCD camera, image captured card and etc, have to be applied in the system to obtain the high axis-oriented measurement precision. In this paper, a new dual CCD camera vision coordinate measurement system based on redundancy principle is proposed to achieve high precision by moderate price. Since two CCD cameras are placed with the angle of camera axis like about 90 degrees to build the system, two sub-systems can be built by each CCD camera and the probe. With the help of the probe the inner and outer parameters of camera are first calibrated, the system by use of redundancy technique is set up now. When axis-oriented error is eliminated within the two sub-systems, which is so large and always exits in the single camera system, the high precision measurement is obtained by the system. The result of experiment compared to that from CMM shows that the system proposed is more excellent in stableness and precision with the uncertainty beyond ±0.1 mm in xyz orient within the distance of 2m using two common CCD cameras.

Paper Details

Date Published: 6 November 2006
PDF: 7 pages
Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63574H (6 November 2006); doi: 10.1117/12.717330
Show Author Affiliations
Shugui Liu, Tianjin Univ. (China)
Kai Peng, Tianjin Univ. (China)
Xuefei Zhang, Tianjin Univ. (China)
Haifeng Zhang, Tianjin Univ. (China)
Fengshan Huang, Hebei Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6357:
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
Jiancheng Fang; Zhongyu Wang, Editor(s)

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