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Proceedings Paper

Application of miniature interferometers in nanomeasuring and positioning technology
Author(s): Jinping Chen; Tong Guo; Xing Fu; Xiaotang Hu
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Paper Abstract

In this article, a work on applying miniature interferometers in nano measuring and positioning system will be introduced. Several types of miniature interferometers, including corner-cube-retroreflector ones, plane-mirror-retroreflector ones and their derivations, will be described. Based on the single-beam plane-mirror interferometers, the triaxial metric system of a Nano Positioning and Measuring Machine (NPMM) is set up. In a working space of 25 mm x 25 mm x 5 mm, the system obeys the "Abbe Principle" to the maximum, having a resolution of 0.1 nm and an uncertainty of measurement of 5 nm - 10 nm.

Paper Details

Date Published: 6 November 2006
PDF: 4 pages
Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63574A (6 November 2006); doi: 10.1117/12.717309
Show Author Affiliations
Jinping Chen, Tianjin Univ. (China)
Tong Guo, Tianjin Univ. (China)
Xing Fu, Tianjin Univ. (China)
Xiaotang Hu, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 6357:
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
Jiancheng Fang; Zhongyu Wang, Editor(s)

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