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Proceedings Paper

Scanning white-light interferometry for microstructures geometrical characterization
Author(s): Tong Guo; Chun-guang Hu; Jin-ping Chen; Xing Fu; Xiao-tang Hu
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Paper Abstract

Scanning white-light interferometry (SWLI) surface profiling for geometrical characterization and device inspection is described in this paper, which is quick, non-destructive, non-contact, and easy to carry out at the wafer scale with sub-micrometer lateral resolution and nanoscale vertical resolution. The measurement system is based on a Mirau microscopic interferometer, using a piezo objective nano-positioner to realize accurate scanning in vertical direction in the range of one hundred micrometers. It employs the method called centroid algorithm to extract the envelope peak position. Comparing with phase shifting interferometry, it has a large measurement range. The measurement accuracy of the system is calibrated by a step height standard which is certificated by NIST. A micro resonator is employed to illustrate the capabilities of SWLI as a measurement and process characterization tool.

Paper Details

Date Published: 6 November 2006
PDF: 7 pages
Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63573O (6 November 2006); doi: 10.1117/12.717253
Show Author Affiliations
Tong Guo, Tianjin Univ. (China)
Chun-guang Hu, Tianjin Univ. (China)
Jin-ping Chen, Tianjin Univ. (China)
Xing Fu, Tianjin Univ. (China)
Xiao-tang Hu, Tianjin Univ. (China)


Published in SPIE Proceedings Vol. 6357:
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
Jiancheng Fang; Zhongyu Wang, Editor(s)

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