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Proceedings Paper

Design of test system of the control and logic transform device of the flight control system based on FPGA
Author(s): Liru Wang; Qingrong Zhang
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Paper Abstract

The control and logic transform device is the centrum of the flight control system. This paper mainly introduces the design of the circuit of the test system which is used to test the control and logic transform device. Based on the hardware and software, the test system can test and fault diagnose the device according to a series of given test vectors. Besides, the test system can collect and test some flight analog signals, such as the power signal, the pitching signal, the leaning signal, the Mach number, the height number and etc. The test system is made up of the testing object, the logic control and interface circuit and the computer. The functions of collecting the measurands, controlling, arbitrating and converting the logic signals of the circuit are achieved by the test interface circuit, which is mainly integrated in EPF10K20RC240, Field Programmable Gate Array, produced by the Altera semiconductor corporation. This makes the circuit predigested, the integrated level of the system heightened, the size reduced, the stability and the secrecy of the system ensured. This paper introduces the design of the circuit, the working principles of the logic control and interface circuit, stressing how to use the FPGA to realize integrating the test interface circuit mostly. Some details which should be paid much attention to about the emulation and the design are also discussed in this paper. Finally, the paper introduces how to use power MOSFET as the electron switches to switch the multiplex measurands to realize low power consumption.

Paper Details

Date Published: 24 October 2006
PDF: 6 pages
Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 63572H (24 October 2006); doi: 10.1117/12.717123
Show Author Affiliations
Liru Wang, Beihang Univ. (China)
Qingrong Zhang, Beihang Univ. (China)


Published in SPIE Proceedings Vol. 6357:
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
Jiancheng Fang; Zhongyu Wang, Editor(s)

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