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Proceedings Paper

A novel method of EMC test at the system level of UAV
Author(s): Bo Li; Daqing Huang; Riurui Nie
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Paper Abstract

The purport of EMC (Electromagnetic Compatibility) is that the electric and electronic equipments or subsystems can work normally according to the advanced project requirements in the intentional electromagnetic environments. Nowadays, design for EMC has played a more and more important role in system plan. The UAV (Unmanned Aerial Vehicle) devisers have cognizance of this point too. But it is regretful that the importance of EMC test is often ignored in the design of UAV, especially the test at the system level, to the detriment of total UAV performance. Complete EMC test at the systems level is often a difficult goal, since system is often too large to adequately or efficiently test, or complete UAV is not for test available until initial customer installation, where test could be impractical. And it is more serious that there are no ready-made UAV standards of EMC test at the system level to be complied with. Following a review of definition and background of systems EMC of UAV, along with the relationships between the EMC test at the subsystem level and the test at the system level, the author describes an novel and effective method of EMC test at the system level, continues with the details of the testing items and their academic bases and some noticeable proceedings of the test. Finally, some conclusions of the EMC test at the system level of UAV are given.

Paper Details

Date Published: 24 October 2006
PDF: 5 pages
Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635721 (24 October 2006); doi: 10.1117/12.717103
Show Author Affiliations
Bo Li, Nanjing Univ. of Aeronautics and Astronautics (China)
Daqing Huang, Nanjing Univ. of Aeronautics and Astronautics (China)
Riurui Nie, Nanjing College of Information Technology (China)


Published in SPIE Proceedings Vol. 6357:
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
Jiancheng Fang; Zhongyu Wang, Editor(s)

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