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Proceedings Paper

Research of multiscale morphological filter on low intensity x-ray image system
Author(s): Tangren Dan; Zhenxing Wang; Xin Du; Yan Liu; Tianhui Ding
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Paper Abstract

New structure low intensity x-ray image system is mainly made of a plane plate mode x-ray intensifier of single proximity focus, a CCD data acquisition and a processing subsystem. This paper presents noise source inside the x-ray image system and its characteristics. By analyzing its components, image noise source of the system is found to contain quantum noise, particulate noise and dark noise of CCD. Thus a new combination method of "multi-frame mean with morphological transform filter" is studied in this paper for imaging noise elimination in the low intensity x-ray image system. Firstly, some frames of images are superimposed for mean image calculation based on the principle of noise non-correlation. Secondly, different with traditional methods of morphological transform filtering algorithm, difference image information is referred in the algorithm for source image de-noising. Based on multi-scale morphological principle, the difference image, obtained from the source image, contains both image noise and characters. After subsequent processing of wavelet translation and fuzzy algorithm, the noise of the difference image is eliminated. Thus when the processed difference image is added onto the last filtered image by the multi-scale morphological filter, the advanced image without noise is achieved which still keeps the source image characters.

Paper Details

Date Published: 24 October 2006
PDF: 5 pages
Proc. SPIE 6357, Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence, 635704 (24 October 2006); doi: 10.1117/12.716678
Show Author Affiliations
Tangren Dan, Tsinghua Univ. (China)
Zhenxing Wang, Tsinghua Univ. (China)
Xin Du, Tsinghua Univ. (China)
Yan Liu, Tsinghua Univ. (China)
Tianhui Ding, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 6357:
Sixth International Symposium on Instrumentation and Control Technology: Signal Analysis, Measurement Theory, Photo-Electronic Technology, and Artificial Intelligence
Jiancheng Fang; Zhongyu Wang, Editor(s)

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