Share Email Print
cover

Proceedings Paper

Machine tool 3D volumetric positioning error measurement under various thermal conditions
Author(s): O. Svoboda; P. Bach; G. Liotto; C. Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

To manufacture good quality or accurate parts, the measurement and compensation of three dimensional volumetric positioning errors of a machine tool are very important. Using a conventional laser interferometer to measure the straightness and squareness errors is very difficult and time consuming. Recently, Optodyne has developed a laser vector technique for the measurement of 3D volumetric positioning errors, including 3 linear displacement errors, 6 straightness errors and 3 squareness errors in a very short time. Using this laser vector technique combine with the data obtained from a set of thermocouples placed at key locations of the machine tool structure, the relations between the machine temperature distribution and the 3D positioning errors can be measured and modeled. The results can be used to compensate the 3D volumetric positioning errors under various thermal conditions. Reported here are the definition of the 3D volumetric positioning errors; the basic theory and description of the laser vector technique; the temperature sensors and the laser vector technique measurement results obtained on a vertical CNC machining center under different spindle load, machine temperature and environmental temperature.

Paper Details

Date Published: 13 October 2006
PDF: 7 pages
Proc. SPIE 6280, Third International Symposium on Precision Mechanical Measurements, 62801N (13 October 2006); doi: 10.1117/12.716567
Show Author Affiliations
O. Svoboda, Research Ctr. of Manufacturing Technology (Czech Republic)
P. Bach, Czech Technical Univ. in Prague (Czech Republic)
G. Liotto, Optodyne, Inc. (United States)
C. Wang, Optodyne, Inc. (United States)


Published in SPIE Proceedings Vol. 6280:
Third International Symposium on Precision Mechanical Measurements
Kuang-Chao Fan; Wei Gao; Xiaofen Yu; Wenhao Huang; Penghao Hu, Editor(s)

© SPIE. Terms of Use
Back to Top