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Proceedings Paper

Blocked force and free displacement characterization of PMN-32%PT stacks
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Paper Abstract

A comparison of stack load-line (including blocked force and free displacement) as well as dynamic response of two single crystal PMN-32%PT stacks is provided in this study. The first stack is a 7mm diameter by 0.5mm thickness 60 layer single crystal stack while the second stack is a 6mm diameter by 0.3mm thickness 100 layer single crystal stack. Blocked force and free displacement measurements were both performed under DC driving conditions. Free displacement measurements showed that under 500V driving conditions displacements approaching 87&mgr;m (~2500ppm) and 48&mgr;m (~1450ppm) were obtained for the 6mm and 7mm diameter stacks, respectively. Experimental blocked force measurements correlated well with theoretical predictions with experimental values approaching 709N and 685N for the 6mm and 7mm diameter stacks, respectively. The error between the theoretical predictions and experimental values was attributed to the linear load line assumption in the theoretical model whereas the stack stiffness is dependent upon the applied force. Dynamic measurements performed under a pre-stress of 4MPa indicated an increase in the strain at frequencies above 500Hz for driving frequencies up to 1000Hz. This was unexpected as the PMN stack resonance was calculated to be on the order of several kHz.

Paper Details

Date Published: 6 April 2007
PDF: 11 pages
Proc. SPIE 6526, Behavior and Mechanics of Multifunctional and Composite Materials 2007, 652603 (6 April 2007); doi: 10.1117/12.716349
Show Author Affiliations
Nersesse Nersessian, Techno-Sciences Inc. (United States)
Anirban Chaudhuri, Univ. of Maryland, College Park (United States)
Shaju John, Univ. of Maryland, College Park (United States)
Gang Wang, Techno-Sciences Inc. (United States)
Norman M. Wereley, Univ. of Maryland, College Park (United States)


Published in SPIE Proceedings Vol. 6526:
Behavior and Mechanics of Multifunctional and Composite Materials 2007
Marcelo J. Dapino, Editor(s)

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