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Proceedings Paper

Measurement of electrical signals for build-up welding with trailing peening based on virtual instrument
Author(s): Jianjun Hao; Jichun Lu; Jianchang Li; Yuejin Ma
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Paper Abstract

Build-up welding with trailing peening can achieve dispelling residual stress, meliorating the structure of welding and improving the fatigue life and quality of welding through peening welded seam and heat-affected zone (HAZ) timely along with welding. Some studies have proven that the peening performance depends greatly on the temperature of welded seam and HAZ. In this paper, a set of temperature measurement system was designed by integrate sensor technology, computer technology, data processing method and modeling technology. In order to achieve gathering electrical signal, calculating temperature field and forecasting peening location, the virtual instrument programming language Labwindows/CVI was adopted to program data acquisition and analysis in software and PC, high-speed data acquisition card model AMPCI-9111, voltage sensor model KV25A/P and current sensor KA200V were adopted in hardware. The process can be summarized as follows:i) gather voltage and current data of build-up welding; ii) set up temperature field model of build-up welding; iii) offer the reliable temperature parameter for confirming the best peening opportunity. The build-up test was conducted and the results indicate that the system can be used to simulate temperature field and forecast the peening location and opportunity accurately.

Paper Details

Date Published: 13 October 2006
PDF: 6 pages
Proc. SPIE 6280, Third International Symposium on Precision Mechanical Measurements, 62802N (13 October 2006); doi: 10.1117/12.716286
Show Author Affiliations
Jianjun Hao, Agricultural Univ. of Hebei (China)
Jichun Lu, Agricultural Univ. of Hebei (China)
Jianchang Li, Agricultural Univ. of Hebei (China)
Yuejin Ma, Agricultural Univ. of Hebei (China)


Published in SPIE Proceedings Vol. 6280:
Third International Symposium on Precision Mechanical Measurements
Kuang-Chao Fan; Wei Gao; Xiaofen Yu; Wenhao Huang; Penghao Hu, Editor(s)

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