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Proceedings Paper

A contact CMM probe based on parallel optical detecting
Author(s): Yonghong Wang; Xiaofen Yu
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Paper Abstract

Based on parallel optical detecting principle, a contact CMM probe is proposed. A 2D light source array produced by the micro-optic component is used to form parallel micro-astigmatism system. When the probe comes into contact with workpiece, the reflecting point of each astigmatism path was deflected. The deflect information can be got through the change of the light intensity and the probe position can be obtained finally. It combines the advantages of optical non-contact method and mechanical contact one. The probe could provide trigger signal and zero cross detection, it also could obtain XYZ micrometer signal. Compared with the traditional electric trigger probe, the probe is simple in the mechanism with high precision, and it is easy to realize the micromation and integration. The construction and working principle of the contact CMM probe are investigated. Furthermore, experiment result is obtained, which accords with theory analysis. It indicates that parallel optical detecting method is applicable in contact CMM probe.

Paper Details

Date Published: 25 October 2006
PDF: 6 pages
Proc. SPIE 6280, Third International Symposium on Precision Mechanical Measurements, 62800R (25 October 2006); doi: 10.1117/12.716183
Show Author Affiliations
Yonghong Wang, Hefei Univ. of Technology (China)
Xiaofen Yu, Hefei Univ. of Technology (China)


Published in SPIE Proceedings Vol. 6280:
Third International Symposium on Precision Mechanical Measurements
Kuang-Chao Fan; Wei Gao; Xiaofen Yu; Wenhao Huang; Penghao Hu, Editor(s)

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