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Proceedings Paper

Study of the development platform of smart piezoelectricity sensors
Author(s): Longjiang Zheng; Haiyu Hou; Xuhui Tang; Yutian Wang
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Paper Abstract

With the emergence of the IEEE1451 standard, the development of smart sensor becomes more important to the manufacture of sensor. IEEE1451 standard is a set of standards that were established to address smart sensor systems and to develop a comprehensive set of sensor and software protocols. This standard defines a table of parameters that are held in the EEPROM of the sensors, named Transducer Electronic Datasheet (TEDS). TEDS can store much information of the transducer such as manufacture ID, model number, serial number, version letter, user date and calibration date and so on. In this paper, IEPE accelerometer is adopted as the piezoelectricity sensors in which TEDS is embed. DS2431 1024 bits 1-Wire programmable read-only memorizer is taken as the memorizer of TEDS date. DS9097U 1-Wire COM serial adapter is adopted to connect the 1-Wire device and RS-232 of the PC to transfer date between them. At last, use LabVIEW application to read and write the date of TEDS on the computer. The basic information of sensors can be written into TEDS and also can be changed through LabVIEW application. The main purpose of the development platform is to accomplish the read and write of the TDES data based on the IEEE1451 standard by using LabVIEW application. Then the sensor can be made to be smart, and the main task of the development platform is to compile program to read and write the information of TEDS.

Paper Details

Date Published: 13 October 2006
PDF: 6 pages
Proc. SPIE 6280, Third International Symposium on Precision Mechanical Measurements, 628017 (13 October 2006); doi: 10.1117/12.716171
Show Author Affiliations
Longjiang Zheng, Yanshan Univ. (China)
Haiyu Hou, Yanshan Univ. (China)
Xuhui Tang, Yanshan Univ. (China)
Yutian Wang, Yanshan Univ. (China)


Published in SPIE Proceedings Vol. 6280:
Third International Symposium on Precision Mechanical Measurements
Kuang-Chao Fan; Wei Gao; Xiaofen Yu; Wenhao Huang; Penghao Hu, Editor(s)

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