Share Email Print
cover

Proceedings Paper

Comparison between ASME and ISO standards on surface texture
Author(s): Kai Hu; Xiangqian Jiang; Xiaojun Liu; Zhengao Xu
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Surface texture is generally a significant technique requirement of high-tech products. Surface quality information can usually play an increasing role in achieving interoperability among existing products, create order in markets, simplify production and ensure safety. As the most authoritative standard organizations, ASME and ISO services are used throughout the world, their codes and standards influence global manufacturers and consumers. ASME B46.1 is one of many vital tools to promote surface measurement techniques, while ISO has a set standard system for surface measurement, analysis and evaluation. This paper compares the ASME B46.1 (2002) standard (Surface texture: surface roughness, waviness, and lay) with ISO 3274 (1997) standard on methods of surface profiles filtering. It preformed the present research in order to show the latest developments of the ASME B46.1 (2002) in the regime of contact profiling techniques where the degree of measurement control is highly advanced, and a large range of other techniques that present valid and useful descriptions of surface texture. Also, this paper shows the differences of terms, definitions and surface texture parameters between ASME B46.1 (2002) and ISO 4287 (1998). The different evaluation results have been calculated based on above two standards for the same surface data. Obviously, it is necessary to consider the divergence above to develop China's standards (GB) on surface texture.

Paper Details

Date Published: 13 October 2006
PDF: 7 pages
Proc. SPIE 6280, Third International Symposium on Precision Mechanical Measurements, 62801W (13 October 2006); doi: 10.1117/12.716169
Show Author Affiliations
Kai Hu, Huazhong Univ. of Science and Technology (China)
Xiangqian Jiang, Huazhong Univ. of Science and Technology (China)
Univ. of Huddersfield (United Kingdom)
Xiaojun Liu, Huazhong Univ. of Science and Technology (China)
Zhengao Xu, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 6280:
Third International Symposium on Precision Mechanical Measurements
Kuang-Chao Fan; Wei Gao; Xiaofen Yu; Wenhao Huang; Penghao Hu, Editor(s)

© SPIE. Terms of Use
Back to Top