Share Email Print
cover

Proceedings Paper

Photoelectrical effect and current-voltage characteristics in DNA-metal Schottky barriers
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We report the first observation of unanticipated photoelectric effects (PE) under visible and near-infrared illuminations and diode-type rectifying current-voltage (I-V) characteristics in DNA-metal contact devices. These devices are constructed with DNA film sandwiched between gold (or some other metal) and transparent conductive ITO electrodes. Since the gold work function and the bangaps of ITO and DNA are greater than 4 eV, in order to release an electron in these materials, the photon energy must be greater than 4 eV, indicating an ultraviolet light source is needed. To explain these phenomena, we hypothesize that a Schottky barrier was formed at DNA-gold interfaces when the gold layer was deposited on the soft DNA film during the sputtering process. The Schottky barrier could replace the gold work function in the DNA-gold interface and greatly reduce the potential barriers. The lowered Schottky potential barrier allowed the electrons, excited by lower photon energies, to overcome the barrier into the conduction band and generate photocurrent. The observed photoelectrical effect was used to measure a ~1.52eV Schottky barrier height in DNA-gold contacts. Furthermore, we measured static I-V characteristics of the DNA-metal devices showing typical diode-rectifying behaviors. The observed photoelectrical effect and I-V characteristics strongly suggest a Schottky barrier at the DNA-metal interface.

Paper Details

Date Published: 8 February 2007
PDF: 10 pages
Proc. SPIE 6470, Organic Photonic Materials and Devices IX, 64700A (8 February 2007); doi: 10.1117/12.716083
Show Author Affiliations
De Yu Zang, IPITEK (United States)
James G. Grote, U.S. Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 6470:
Organic Photonic Materials and Devices IX
James G. Grote; Francois Kajzar; Nakjoong Kim, Editor(s)

© SPIE. Terms of Use
Back to Top