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Proceedings Paper

Study of the transverse shear mode resonator with coupled viscoelastic layer by scanning tunneling microscopy
Author(s): Chueh-Yu Wu; Chun-Kuang Chen; Kuang-Chong Wu; Wen-Jong Wu; Chih-Kung Lee
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Paper Abstract

Nowadays, the classical modeling of quartz crystal microbalance (QCM) describes the relationship between frequency and mass; resistance and viscosity are widely accepted and used for many years. It is clear that the mass loading decreases the resonance frequency, and the viscoelastic damping increases the resistance of quartz resoance. Due to rapidly advancement of electronics techniques, these effects can be easily read out through an advanced electronic circuitry precisely. However, the influence of the oscillatory condition by a bio-molecule layer on the top of quartz is more complex and beyond the scope of classical model due to coupled vicoelastic effect. The dynamics of the quartz crystal shear mode resonance are difficult observed by traditional metrology techniques because of the very small vibration amplitude. Scanning tunneling microscope (STM) which can scan the surface in atomic level provides a new route to study and analyze the interaction between quartz and bio-molecule viscoelastic layers. STM not only can detect the tiny vibrational changes but also can observes the process of growth of a viscoelastic layer consisting of biological materials. The measurement of dynamic behaviors of QCM with STM will be presented in this paper.

Paper Details

Date Published: 11 April 2007
PDF: 7 pages
Proc. SPIE 6528, Nanosensors, Microsensors, and Biosensors and Systems 2007, 65281D (11 April 2007); doi: 10.1117/12.715895
Show Author Affiliations
Chueh-Yu Wu, National Taiwan Univ. (Taiwan)
Chun-Kuang Chen, National Taiwan Univ. (Taiwan)
Kuang-Chong Wu, National Taiwan Univ. (Taiwan)
Wen-Jong Wu, National Taiwan Univ. (Taiwan)
Chih-Kung Lee, National Taiwan Univ. (Taiwan)

Published in SPIE Proceedings Vol. 6528:
Nanosensors, Microsensors, and Biosensors and Systems 2007
Vijay K. Varadan, Editor(s)

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