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Proceedings Paper

Internal damage localization in a thick plate using moving sensing windows
Author(s): Yong-Han Kim
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Proc. SPIE 6529, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2007, 65292P; doi: 10.1117/12.715873
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Yong-Han Kim, Yooshin Engineering Corp. (South Korea)


Published in SPIE Proceedings Vol. 6529:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2007
Masayoshi Tomizuka; Chung-Bang Yun; Victor Giurgiutiu, Editor(s)

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