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Proceedings Paper

A hybrid 802.16/802.11 network architecture for a United States coastal area network
Author(s): Jack L. Burbank; William T. Kasch; Julia Andrusenko; Brian K. Haberman; Robert Nichols; Harold Zheng
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Paper Abstract

This paper presents a concept for a United States Coastal Area Network (U-SCAN) that is comprised of IEEE 802.11, 802.16, and satellite communications technologies. The Office of Naval Research (ONR) on behalf of the National Oceanographic Partnership Program (NOPP) has tasked The Johns Hopkins University Applied Physics Laboratory (JHU/APL) to perform an architectural study into the establishment of a United States Coastal Area Network (U-SCAN). The goal of this study is to define a wireless network architecture that can be deployed to enable contiguous coastal area network coverage for scientific, commercial, and homeland security (e.g. Coast Guard) applications within the United States Exclusive Economic Zone (EEZ), in a manner that is flexible, manageable, and affordable. The JHU/APL study will ultimately provide recommendations to NOPP regarding potential network architectures and technologies that could provide the desired capability, with a particular focus on commercial (both existing and emerging) technologies. This paper presents the envisioned U-SCAN architecture, and presents the envisioned technical capabilities and shortcomings of the component candidate technologies.

Paper Details

Date Published: 3 May 2007
PDF: 10 pages
Proc. SPIE 6577, Wireless Sensing and Processing II, 657702 (3 May 2007); doi: 10.1117/12.714373
Show Author Affiliations
Jack L. Burbank, The Johns Hopkins Univ. (United States)
William T. Kasch, The Johns Hopkins Univ. (United States)
Julia Andrusenko, The Johns Hopkins Univ. (United States)
Brian K. Haberman, The Johns Hopkins Univ. (United States)
Robert Nichols, The Johns Hopkins Univ. (United States)
Harold Zheng, The Johns Hopkins Univ. (United States)

Published in SPIE Proceedings Vol. 6577:
Wireless Sensing and Processing II
Raghuveer M. Rao; Sohail A. Dianat; Michael D. Zoltowski, Editor(s)

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