Share Email Print
cover

Proceedings Paper

Lifetime prediction of diode lasers with different ageing behavior
Author(s): Yajun Li
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Regression models are developed for lifetime prediction of diode lasers with increasing or decreasing operating current in the gradual degradation stage of their lifetime. Programmable expressions for laser lifetime extrapolation are presented. Analytical results are explicated by case examples based on measured data from reliability tests of commercially available 10mW and 650nm wavelength InGaAlP lasers conducted under accelerated ageing conditions.

Paper Details

Date Published: 27 February 2007
PDF: 10 pages
Proc. SPIE 6485, Novel In-Plane Semiconductor Lasers VI, 648519 (27 February 2007); doi: 10.1117/12.713935
Show Author Affiliations
Yajun Li, Consultant (United States)


Published in SPIE Proceedings Vol. 6485:
Novel In-Plane Semiconductor Lasers VI
Carmen Mermelstein; David P. Bour, Editor(s)

© SPIE. Terms of Use
Back to Top