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Proceedings Paper

Lifetime prediction of diode lasers with different ageing behavior
Author(s): Yajun Li
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Paper Abstract

Regression models are developed for lifetime prediction of diode lasers with increasing or decreasing operating current in the gradual degradation stage of their lifetime. Programmable expressions for laser lifetime extrapolation are presented. Analytical results are explicated by case examples based on measured data from reliability tests of commercially available 10mW and 650nm wavelength InGaAlP lasers conducted under accelerated ageing conditions.

Paper Details

Date Published: 27 February 2007
PDF: 10 pages
Proc. SPIE 6485, Novel In-Plane Semiconductor Lasers VI, 648519 (27 February 2007); doi: 10.1117/12.713935
Show Author Affiliations
Yajun Li, Consultant (United States)

Published in SPIE Proceedings Vol. 6485:
Novel In-Plane Semiconductor Lasers VI
Carmen Mermelstein; David P. Bour, Editor(s)

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