Share Email Print
cover

Proceedings Paper

Setting up task-optimal illumination automatically for inspection purposes
Author(s): Jani Uusitalo; Reijo Tuokko
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Illumination with correct intensity and direction can help solving even very complicated inspection and measurement problems by hiding unnecessary information and by enhancing the contrast where it is needed. The 'wave and look' approach used widely in the vision industry requires knowledge about different illumination techniques and the measurement problem. One illumination is not optimal for all tasks performed using one vision system and so even more complex illumination combinations can be expected, particularly on small-batch production lines. We describe approaches for producing flexible light sources for machine vision purposes. Our devices allow one to change the scene illumination by software. Often only one programmable light source is needed per one vision system despite very different illumination needs. We also describe an automated tuning approach that controls programmable light sources on-line to correct the image seen by the sensor to maximize the illumination uniformness, contrasts, or even the part measurement robustness. The paper also shows the results of test cases and discusses ways to further improve them.

Paper Details

Date Published: 17 February 2007
PDF: 8 pages
Proc. SPIE 6503, Machine Vision Applications in Industrial Inspection XV, 65030K (17 February 2007); doi: 10.1117/12.712858
Show Author Affiliations
Jani Uusitalo, Tampere Univ. of Technology (Finland)
Reijo Tuokko, Tampere Univ. of Technology (Finland)


Published in SPIE Proceedings Vol. 6503:
Machine Vision Applications in Industrial Inspection XV
Fabrice Meriaudeau; Kurt S. Niel, Editor(s)

© SPIE. Terms of Use
Back to Top