Share Email Print

Proceedings Paper

Surface inspection of hard to reach industrial parts using low-coherence interferometry
Author(s): M. L. Dufour; G. Lamouche; S. Vergnole; B. Gauthier; C. Padioleau; M. Hewko; S. Lévesque; V. Bartulovic
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Optical inspection tools based on low-coherence interferometry and specialized for hard to reach industrial parts are presented. A common path configuration using optical fiber components is described. Small diameter probes originally developed for biomedical applications have been specialized for industrial inspection. Probes that can be used with a Cartesian surface scanning system or a cylindrical scanning system are presented. The probes include a reference that makes absolute accuracy measurements easier. Characterization of the internal surface of a worn plasma torch electrode has been realized using that technique. Surface profiling of the barrel of a gun was also performed.

Paper Details

Date Published: 8 September 2006
PDF: 7 pages
Proc. SPIE 6343, Photonics North 2006, 63431Z (8 September 2006); doi: 10.1117/12.707806
Show Author Affiliations
M. L. Dufour, National Research Council Canada (Canada)
G. Lamouche, National Research Council Canada (Canada)
S. Vergnole, National Research Council Canada (Canada)
B. Gauthier, National Research Council Canada (Canada)
C. Padioleau, National Research Council Canada (Canada)
M. Hewko, National Research Council Canada (Canada)
S. Lévesque, Forensic Technology (Canada)
V. Bartulovic, Novacam Technologies Inc. (Canada)

Published in SPIE Proceedings Vol. 6343:
Photonics North 2006
Pierre Mathieu, Editor(s)

© SPIE. Terms of Use
Back to Top