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Proceedings Paper

Techniques for characterizing waveguide gratings and grating-based devices
Author(s): Ernst Brinkmeyer; Sven Kieckbusch; Frank Knappe
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Paper Abstract

Waveguide gratings used in laser technology, optical sensing or optical communications have to serve different specific purposes and, hence, have to have specific optical properties which can be tailored to a large extent. Characterization methods are required not only to measure the actual effect of a Bragg grating or long period grating under consideration but also to unveil the cause, i.e. to determine its spatial structure. This paper reviews the present status of the respective experimental characterization techniques. The methods emphasized rely on phase sensitive reflectometry together with advanced inverse scattering evaluation algorithms.

Paper Details

Date Published: 8 September 2006
PDF: 14 pages
Proc. SPIE 6343, Photonics North 2006, 63431U (8 September 2006); doi: 10.1117/12.707798
Show Author Affiliations
Ernst Brinkmeyer, Technische Univ. Hamburg-Harburg (Germany)
Sven Kieckbusch, Technische Univ. Hamburg-Harburg (Germany)
Frank Knappe, Technische Univ. Hamburg-Harburg (Germany)

Published in SPIE Proceedings Vol. 6343:
Photonics North 2006
Pierre Mathieu, Editor(s)

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