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Proceedings Paper

Near-field microwave diagnostics with nonlinear-optical sensors
Author(s): John F. Whitaker; Kyoung Yang; Chia-Chu Chen
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Paper Abstract

The concept and implementation of a near-field microwave measurement system that relies on the Pockels effect in fiber-coupled, semi-insulating GaAs probes to acquire polarization-sensitive maps of electric-field patterns in close proximity to antenna arrays, integrated circuits, and packaged components, is presented. The evolution of the electro-optic field-mapping technique, which has subsequently addressed magnetic-field characterization via magneto-optic sensing and temperature measurement through semiconductor band-gap modulation, will also be discussed. The use of emerging materials, such as diluted magnetic semiconductors, is also considered.

Paper Details

Date Published: 8 February 2007
PDF: 9 pages
Proc. SPIE 6471, Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV, 64710U (8 February 2007); doi: 10.1117/12.707781
Show Author Affiliations
John F. Whitaker, Univ. of Michigan (United States)
Opteos Inc. (United States)
Kyoung Yang, Opteos Inc. (United States)
Chia-Chu Chen, Univ. of Michigan (United States)


Published in SPIE Proceedings Vol. 6471:
Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV
Marshall J. Cohen; Kong-Thon Tsen; Joseph P. Estrera; Jin-Joo Song, Editor(s)

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