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Proceedings Paper

Device calibration method for optical light modulator
Author(s): Yousun Bang; Aron Baik; Dusik Park; Injae Yeo; Jaeho Han
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Paper Abstract

Due to subtle misalignment of optical components in the fabrication process, images projected by an optical light modulator have severe line artifact along the direction of the optical scan. In this paper, we propose a novel methodology to calibrate the modulator and generate the compensate image for the misaligned optical modulator in order to eliminate the line artifact. A camera system is employed to construct Luminance Transfer Function (LTF) that characterizes the optical modulator array. Spatial uniformity is obtained by redefining the dynamic range and compensating the characteristic curvature of the LTF for each optical modulator array element. Simulation results show significant reduction in the visibility of line artifact.

Paper Details

Date Published: 29 January 2007
PDF: 10 pages
Proc. SPIE 6493, Color Imaging XII: Processing, Hardcopy, and Applications, 64930D (29 January 2007); doi: 10.1117/12.704890
Show Author Affiliations
Yousun Bang, Samsung Advanced Institute of Technology (South Korea)
Aron Baik, Samsung Advanced Institute of Technology (South Korea)
Dusik Park, Samsung Advanced Institute of Technology (South Korea)
Injae Yeo, Samsung Electro-Mechanics (South Korea)
Jaeho Han, Samsung Electro-Mechanics (South Korea)


Published in SPIE Proceedings Vol. 6493:
Color Imaging XII: Processing, Hardcopy, and Applications
Reiner Eschbach; Gabriel G. Marcu, Editor(s)

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